번호 | 제목 | 게재수준 | 게재일자 |
---|---|---|---|
81 |
Contribution of Ion Energy and Flux on High-Aspect Ratio SiO2 Etching Characteristics in a Dual-Frequency Capacitively Coupled Ar/C4F8 Plasma: Individual Ion Energy and Flux Controlled
SCIE (Science Citation Index Expanded)
2023-05-18
|
SCIE (Science Citation Index Expanded) | 2023-05-18 |
80 |
Analysis of the transmission spectrum of the microwave cutoff probe influenced by the sheath around the probe
SCIE (Science Citation Index Expanded)
2023-05-01
|
SCIE (Science Citation Index Expanded) | 2023-05-01 |
79 |
On the Quenching of Electron Temperature in Inductively Coupled Plasma
SCIE (Science Citation Index Expanded)
2023-04-19
|
SCIE (Science Citation Index Expanded) | 2023-04-19 |
78 |
Determination of Plasma Potential Using an Emissive Probe with Floating Potential Method
SCIE (Science Citation Index Expanded)
2023-03-30
|
SCIE (Science Citation Index Expanded) | 2023-03-30 |
77 |
Real-time monitoring of the plasma density distribution in low-pressure plasmas using a flat-cutoff array sensor
SCIE (Science Citation Index Expanded)
2023-03-16
|
SCIE (Science Citation Index Expanded) | 2023-03-16 |
76 |
Development of the Tele-Measurement of Plasma Uniformity via Surface Wave Information (TUSI) Probe for Non-Invasive In-Situ Monitoring of Electron Density Uniformity in Plasma Display Fabrication Process
SCIE (Science Citation Index Expanded)
2023-02-24
|
SCIE (Science Citation Index Expanded) | 2023-02-24 |
75 |
Analysis on crossing frequency in transmission microwave frequency spectrum of the cutoff probe
SCIE (Science Citation Index Expanded)
2023-02-22
|
SCIE (Science Citation Index Expanded) | 2023-02-22 |
74 |
Computational Analysis on Self-Resonance Frequency of Solenoid and Planar Inductor
SCOPUS
2023-02-14
|
SCOPUS | 2023-02-14 |
73 |
Effect of mixing CF4 with O-2 on electron characteristics of capacitively coupled plasma
SCIE (Science Citation Index Expanded)
2023-01-09
|
SCIE (Science Citation Index Expanded) | 2023-01-09 |
72 |
Investigation into SiO2 Etching Characteristics Using Fluorocarbon Capacitively Coupled Plasmas: Etching with Radical/Ion Flux-Controlled
SCIE (Science Citation Index Expanded)
2022-12-15
|
SCIE (Science Citation Index Expanded) | 2022-12-15 |